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Information card for entry 1519150
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| Coordinates | 1519150.cif |
|---|
| Formula | C35 H66 Cl2 N2 P2 Se2 Ti |
|---|---|
| Calculated formula | C35 H66 Cl2 N2 P2 Se2 Ti |
| SMILES | [Ti]12([Se]P(=[N]1C1CCCCC1)(C(C)(C)C)C(C)(C)C)([Se]P(=[N]2C1CCCCC1)(C(C)(C)C)C(C)(C)C)(Cl)Cl.c1ccccc1C |
| Title of publication | C28H58Cl2N2P2Se2Ti, C7H8 |
| Authors of publication | Bochmann, Manfred; Coles, Simon J.; Hursthouse, Michael B. |
| Journal of publication | Crystal Structure Report Archive |
| Year of publication | 1994 |
| Pages of publication | 1196 |
| a | 13.233 ± 0.007 Å |
| b | 17.2161 ± 0.001 Å |
| c | 35.163 ± 0.011 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 8011 ± 5 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 61 |
| Hermann-Mauguin space group symbol | P b c a |
| Hall space group symbol | -P 2ac 2ab |
| Residual factor for all reflections | 0.0763 |
| Residual factor for significantly intense reflections | 0.0433 |
| Weighted residual factors for significantly intense reflections | 0.088 |
| Weighted residual factors for all reflections included in the refinement | 0.0959 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.008 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 176729 (current) | 2016-02-18 | cif/ (antanas@echidna.ibt.lt) Replacing _[local]_cod_* tags with their equivalents from the COD CIF dictionary in multiple entries in range 1. |
1519150.cif |
| 135462 | 2015-04-30 | cif/ Adding structures of 1519150 via cif-deposit CGI script. |
1519150.cif |
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Users of the data should acknowledge the original authors of the
structural data.