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Information card for entry 2242431
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| Coordinates | 2242431.cif |
|---|---|
| Structure factors | 2242431.hkl |
| Original IUCr paper | HTML |
| Common name | Cesium Bistriflimide |
|---|---|
| Chemical name | Poly[[μ~4~-bis[(trifluoromethyl)sulfonyl]imido]caesium(I)] |
| Formula | C2 Cs F6 N O4 S2 |
| Calculated formula | C2 Cs F6 N O4 S2 |
| SMILES | [Cs+].[O-]S(=O)(C(F)(F)F)=NS(=O)(=O)C(F)(F)F |
| Title of publication | Cs[Tf~2~N]: a second polymorph with a layered structure |
| Authors of publication | Stritzinger, Jared T.; Droessler, Janelle E.; Scott, Brian L.; Goff, George S. |
| Journal of publication | Acta Crystallographica Section E |
| Year of publication | 2018 |
| Journal volume | 74 |
| Journal issue | 4 |
| Pages of publication | 551 - 554 |
| a | 11.431 ± 0.004 Å |
| b | 6.918 ± 0.002 Å |
| c | 13.469 ± 0.004 Å |
| α | 90° |
| β | 103.686 ± 0.004° |
| γ | 90° |
| Cell volume | 1034.9 ± 0.6 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0317 |
| Residual factor for significantly intense reflections | 0.0221 |
| Weighted residual factors for significantly intense reflections | 0.0527 |
| Weighted residual factors for all reflections included in the refinement | 0.0577 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.992 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
| Revision | Date | Message | Files |
|---|---|---|---|
| 207093 (current) | 2018-03-24 | cif/ hkl/ Adding structures of 2242431 via cif-deposit CGI script. |
2242431.cif 2242431.hkl |
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Users of the data should acknowledge the original authors of the
structural data.