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Information card for entry 4001778
Preview
| Coordinates | 4001778.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | K1.316 Mg0.658 S4 Sn1.342 |
|---|---|
| Calculated formula | K1.32 Mg0.66 S4 Sn1.34 |
| Title of publication | Selective Removal of Cs+, Sr2+, and Ni2+by K2xMgxSn3‒xS6(x= 0.5‒1) (KMS-2) Relevant to Nuclear Waste Remediation |
| Authors of publication | Mertz, Joshua L.; Fard, Zohreh Hassanzadeh; Malliakas, Christos D.; Manos, Manolis J.; Kanatzidis, Mercouri G. |
| Journal of publication | Chemistry of Materials |
| Year of publication | 2013 |
| Journal volume | 25 |
| Journal issue | 10 |
| Pages of publication | 2116 |
| a | 3.6749 ± 0.0004 Å |
| b | 3.6749 ± 0.0004 Å |
| c | 16.827 ± 0.004 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 196.8 ± 0.06 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 4 |
| Space group number | 194 |
| Hermann-Mauguin space group symbol | P 63/m m c |
| Hall space group symbol | -P 6c 2c |
| Residual factor for all reflections | 0.0557 |
| Residual factor for significantly intense reflections | 0.0437 |
| Weighted residual factors for significantly intense reflections | 0.1198 |
| Weighted residual factors for all reflections included in the refinement | 0.123 |
| Goodness-of-fit parameter for significantly intense reflections | 2.51 |
| Goodness-of-fit parameter for all reflections included in the refinement | 2.4 |
| Diffraction radiation wavelength | 0.4428 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 176432 (current) | 2016-02-14 | cif/ (antanas@kurmis) Replacing _[local]_cod_* tags with their equivalents from the COD CIF dictionary in multiple entries. |
4001778.cif |
| 87154 | 2013-07-14 | cif/ Adding structures of 4001778 via cif-deposit CGI script. |
4001778.cif |
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Users of the data should acknowledge the original authors of the
structural data.