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Information card for entry 4002170
Preview
| Coordinates | 4002170.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Cu3.2 O30 Ta11 |
|---|---|
| Calculated formula | Cu3.192 O30 Ta11 |
| Title of publication | Cu-Deficiency in thep-Type Semiconductor Cu5‒xTa11O30: Impact on Its Crystalline Structure, Surfaces, and Photoelectrochemical Properties |
| Authors of publication | Sullivan, Ian; Sahoo, Prangya P.; Fuoco, Lindsay; Hewitt, Andrew S.; Stuart, Sean; Dougherty, Daniel; Maggard, Paul A. |
| Journal of publication | Chemistry of Materials |
| Year of publication | 2014 |
| Journal volume | 26 |
| Journal issue | 23 |
| Pages of publication | 6711 |
| a | 6.2359 ± 0.0002 Å |
| b | 6.2359 ± 0.0002 Å |
| c | 32.2139 ± 0.0005 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 1084.86 ± 0.05 Å3 |
| Cell temperature | 298 K |
| Ambient diffraction temperature | 298 K |
| Number of distinct elements | 3 |
| Space group number | 190 |
| Hermann-Mauguin space group symbol | P -6 2 c |
| Hall space group symbol | P -6c -2c |
| Residual factor for all reflections | 0.0396 |
| Residual factor for significantly intense reflections | 0.0391 |
| Weighted residual factors for significantly intense reflections | 0.0256 |
| Weighted residual factors for all reflections included in the refinement | 0.0256 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.88 |
| Method of determination | powder diffraction |
| Diffraction radiation wavelength | 1.54187 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 178377 (current) | 2016-03-21 | cif/4/ (antanas@kurmis) Replacing _[local]_cod_* tags with their equivalents from the COD CIF dictionary in multiple entries in subrange 4/00. |
4002170.cif |
| 131168 | 2015-02-05 | cif/ Adding structures of 4002170 via cif-deposit CGI script. |
4002170.cif |
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Users of the data should acknowledge the original authors of the
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