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Information card for entry 4127249
Preview
Coordinates | 4127249.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C317.33 H285.48 B34.92 Cs0.36 F2.7 Fe4 N37.58 O8.8 S0.9 |
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Calculated formula | C314.15 H285.475 B38.1 Cs0.3645 F2.7 Fe4 N37.575 O8.8 S0.9 |
Title of publication | Enantiopure [Cs<sup>+</sup>/Xe⊂Cryptophane]⊂Fe<sup>II</sup><sub>4</sub>L<sub>4</sub> Hierarchical Superstructures. |
Authors of publication | Zhang, Dawei; Ronson, Tanya K.; Greenfield, Jake L.; Brotin, Thierry; Berthault, Patrick; Léonce, Estelle; Zhu, Jun-Long; Xu, Lin; Nitschke, Jonathan R. |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2019 |
Journal volume | 141 |
Journal issue | 20 |
Pages of publication | 8339 - 8345 |
a | 31.1172 ± 0.0002 Å |
b | 59.4899 ± 0.0003 Å |
c | 49.3791 ± 0.0006 Å |
α | 90° |
β | 92.154 ± 0.001° |
γ | 90° |
Cell volume | 91344 ± 1.3 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 9 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.1864 |
Residual factor for significantly intense reflections | 0.1183 |
Weighted residual factors for significantly intense reflections | 0.3178 |
Weighted residual factors for all reflections included in the refinement | 0.3703 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.096 |
Diffraction radiation wavelength | 0.6889 Å |
Diffraction radiation type | Synchrotron |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
Revision | Date | Message | Files |
---|---|---|---|
223193 (current) | 2019-11-04 | cif/ Updating files of 4127249 Original log message: Adding full bibliography for 4127249.cif. |
4127249.cif |
215096 | 2019-05-13 | cif/ Adding structures of 4127249 via cif-deposit CGI script. |
4127249.cif |
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