Crystallography Open Database

Information card for entry 4327620

Preview

Coordinates	4327620.cif
Original paper (by DOI)	HTML

Structure parameters

Formula	C28 H60 Li2 N8 O2 P2 Si2
Calculated formula	C28 H60 Li2 N8 O2 P2 Si2
SMILES	[Li]1([N]2([Si](C)(C)C)c3cccc4c3c([N]1([Li]2[O]=P(N(C)C)(N(C)C)N(C)C)[Si](C)(C)C)ccc4)[O]=P(N(C)C)(N(C)C)N(C)C
Title of publication	Synthesis and Structural Characterization of Metalated 1,8-Bis(silylamino)naphthalene Derivatives
Authors of publication	Christian H. Galka; Dominique J. M. Trösch; Ina Rüdenauer; Lutz H. Gade; Ian Scowen; Mary McPartlin
Journal of publication	Inorganic Chemistry
Year of publication	2000
Journal volume	39
Pages of publication	4615 - 4620
a	18.983 ± 0.002 Å
b	11.1727 ± 0.0013 Å
c	19.768 ± 0.002 Å
α	90°
β	110.603 ± 0.005°
γ	90°
Cell volume	3924.5 ± 0.7 Å³
Cell temperature	193 ± 2 K
Ambient diffraction temperature	193 ± 2 K
Number of distinct elements	7
Space group number	15
Hermann-Mauguin space group symbol	C 1 2/c 1
Hall space group symbol	-C 2yc
Residual factor for all reflections	0.0579
Residual factor for significantly intense reflections	0.0429
Weighted residual factors for significantly intense reflections	0.1054
Weighted residual factors for all reflections included in the refinement	0.1169
Goodness-of-fit parameter for all reflections included in the refinement	1.035
Diffraction radiation wavelength	0.71073 Å
Diffraction radiation type	MoKα
Has coordinates	Yes
Has disorder	No
Has F_obs	No

Version history

Revision	Date	Message	Files
179379 (current)	2016-03-23	cif/4/32/ (antanas@kurmis) Replacing _[local]_cod_* tags with their equivalents from the COD CIF dictionary in multiple entries in subrange 4/32/76.	4327620.cif
120105	2014-07-12	Adding DOIs to range 4/32 structures.	4327620.cif
61452	2012-07-04	cif/ Adding structures of 4327620 via cif-deposit CGI script.	4327620.cif