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Information card for entry 7228838
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Coordinates | 7228838.cif |
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Original paper (by DOI) | HTML |
Chemical name | (S,S)-Bis(2-hydroxypropylthio)(ethylenedithio) tetrathiafulvalene) bromide |
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Formula | C14 H18 Br O2 S8 |
Calculated formula | C14 H18 Br O2 S8 |
SMILES | [Br-].S1CCSC2=C1SC(S2)=C1SC(=C(S1)SC[C@@H](O)C)SC[C@@H](O)C |
Title of publication | New semiconducting radical-cation salts of chiral bis(2-hydroxylpropylthio)ethylenedithio TTF |
Authors of publication | Lopez, Jordan R.; Martin, Lee; Wallis, John D.; Akutsu, Hiroki; Yamada, Jun-ichi; Nakatsuji, Shin-ichi; Wilson, Claire; Christensen, Jeppe; Coles, Simon J. |
Journal of publication | CrystEngComm |
Year of publication | 2017 |
a | 9.831 ± 0.0002 Å |
b | 19.9437 ± 0.0004 Å |
c | 10.6022 ± 0.0002 Å |
α | 90° |
β | 97.857 ± 0.002° |
γ | 90° |
Cell volume | 2059.22 ± 0.07 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 5 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.0375 |
Residual factor for significantly intense reflections | 0.0342 |
Weighted residual factors for significantly intense reflections | 0.0741 |
Weighted residual factors for all reflections included in the refinement | 0.0759 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.04 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
Revision | Date | Message | Files |
---|---|---|---|
203412 (current) | 2017-11-21 | cif/7 Fixing Z values and formulae accordingly. |
7228838.cif |
199479 | 2017-08-03 | cif/ Adding structures of 7228833, 7228834, 7228835, 7228836, 7228837, 7228838 via cif-deposit CGI script. |
7228838.cif |
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Users of the data should acknowledge the original authors of the
structural data.