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Information card for entry 7712669
Preview
| Coordinates | 7712669.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C42 H43 B F15 N P2 Si |
|---|---|
| Calculated formula | C42 H43 B F15 N P2 Si |
| SMILES | P(C(=C\[B](c1c(F)c(F)c(F)c(F)c1F)(c1c(F)c(F)c(F)c(F)c1F)c1c(F)c(F)c(F)c(F)c1F)\c1ccc(cc1)C)(N(CC)CC)/C(=C\[P+](CC)(CC)CC)[Si](C)(C)C |
| Title of publication | Reactive FLP-alkyne addition products: strategy to anionic and zwitterionic phosphines |
| Authors of publication | Kim, Hyehwang; Stephan, Douglas W. |
| Journal of publication | Dalton Transactions |
| Year of publication | 2023 |
| a | 11.5413 ± 0.0019 Å |
| b | 11.8581 ± 0.0019 Å |
| c | 17.844 ± 0.002 Å |
| α | 89.525 ± 0.007° |
| β | 72.331 ± 0.006° |
| γ | 69.494 ± 0.008° |
| Cell volume | 2166.3 ± 0.6 Å3 |
| Cell temperature | 186.82 K |
| Ambient diffraction temperature | 186.82 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1015 |
| Residual factor for significantly intense reflections | 0.0633 |
| Weighted residual factors for significantly intense reflections | 0.1621 |
| Weighted residual factors for all reflections included in the refinement | 0.1884 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.027 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 282059 (current) | 2023-03-25 | cif/ Adding structures of 7712668, 7712669, 7712670, 7712671 via cif-deposit CGI script. |
7712669.cif |
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Users of the data should acknowledge the original authors of the
structural data.