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CIF Information Card
Information card for 1200020
1200019 << 1200020 >> 1200021Preview
|
Coordinates |
1200020.cif |
Structure parameters
| Common name | Nickel Antimonide Selenide |
| Formula | - Ni5.72 Sb Se2 - |
| Calculated formula | - Ni5.718 Sb Se2 - |
| Title of publication | Synthesis and Properties of a New Metal-Rich Nickel Antimonide Telluride or Selenide: Ni7-SbX2 ( δ ≈ 1.3; X = Se or Te) |
| Authors of publication | Thomas K. Reynolds; Joshua G. Bales; Francis J. DiSalvo |
| Journal of publication | Chemistry of Materials |
| Year of publication | 2002 |
| Journal volume | 14 |
| Journal issue | 11 |
| Pages of publication | 4746 - 4751 |
| a | 3.7021 ± 0.0005 Å |
| b | 3.7021 ± 0.0005 Å |
| c | 18.593 ± 0.004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 254.83 ± 0.07 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 3 |
| Hermann-Mauguin symmetry space group | I 4/mmm |
| Residual factor for all reflections | 0.0534 |
| Residual factor for observed reflections | 0.0534 |
| Weighted residual factors for the observed reflections | 0.1199 |
| Weighted residual factors for all reflections included in the refinement | 0.1199 |
| Goodness-of-fit parameter for observed reflections | 1.279 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |