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CIF Information Card
Information card for 2015233
2015232 << 2015233 >> 2015234Preview
|
Coordinates |
2015233.cif |
|
Structure factors |
2015233.hkl |
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Original IUCr paper |
HTML |
Structure parameters
| Common name | [3,4-b][3',4'-l]-dithieno-1,4,11,14-tetraoxacycloeicosane |
| Chemical name | 1,8,14,20-Tetraoxa-11,23-dithiatricyclo[21.3.0.0^9,13^]hexacosa- 9,12,21,24-tetraene |
| Formula | - C20 H28 O4 S2 - |
| Calculated formula | - C20 H28 O4 S2 - |
| Title of publication | 1,8,14,20-Tetraoxa-11,23-dithiatricyclo[21.3.0.0^9,13^]hexacosa-9,12,21,24-tetraene |
| Authors of publication | Wagner, Paweł; Łapkowski, Mieczysław; Kubicki, Maciej |
| Journal of publication | Acta Crystallographica, Section C |
| Year of publication | 2006 |
| Journal volume | 62 |
| Journal issue | 4 |
| Pages of publication | o155 - o156 |
| a | 9.595 ± 0.002 Å |
| b | 8.267 ± 0.002 Å |
| c | 26.35 ± 0.005 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2090.1 ± 0.8 Å3 |
| Cell temperature | 295 ± 2 K |
| Ambient diffraction temperature | 295 K |
| Number of distinct elements | 4 |
| Hermann-Mauguin symmetry space group | P b c a |
| Hall symmetry space group | -P 2ac 2ab |
| Residual factor for all reflections | 0.1014 |
| Residual factor for observed reflections | 0.0355 |
| Weighted residual factors for the observed reflections | 0.0897 |
| Weighted residual factors for all reflections included in the refinement | 0.1045 |
| Goodness-of-fit parameter for observed reflections | 0.979 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |