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CIF Information Card
Information card for 2015290
2015289 << 2015290 >> 2015291Preview
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Coordinates |
2015290.cif |
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Structure factors |
2015290.hkl |
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Original IUCr paper |
HTML |
Structure parameters
| Chemical name | Tetrakis(pentafluorobenzenethiolato-\kS)(triphenylphosphine-\kP)osmium(IV) |
| Formula | - C42 H15 F20 Os P S4 - |
| Calculated formula | - C42 H15 F20 Os P S4 - |
| Title of publication | Tetrakis(pentafluorobenzenethiolato-κ<i>S</i>)(triphenylphosphine-κ<i>P</i>)osmium(IV): a <i>Z</i>' = 3 structure with a supramolecular double-stranded backbone |
| Authors of publication | Mendoza, María del Consuelo; Bernès, Sylvain; Arroyo, Maribel |
| Journal of publication | Acta Crystallographica, Section C |
| Year of publication | 2006 |
| Journal volume | 62 |
| Journal issue | 5 |
| Pages of publication | m201 - m204 |
| a | 13.0394 ± 0.0013 Å |
| b | 44.781 ± 0.003 Å |
| c | 22.8023 ± 0.0017 Å |
| α | 90° |
| β | 100.051 ± 0.008° |
| γ | 90° |
| Cell volume | 13110.4 ± 1.9 Å3 |
| Cell temperature | 299 ± 2 K |
| Ambient diffraction temperature | 296 ± 1 K |
| Number of distinct elements | 6 |
| Hermann-Mauguin symmetry space group | P 1 21/c 1 |
| Hall symmetry space group | -P 2ybc |
| Residual factor for all reflections | 0.102 |
| Residual factor for observed reflections | 0.0552 |
| Weighted residual factors for the observed reflections | 0.1169 |
| Weighted residual factors for all reflections included in the refinement | 0.1435 |
| Goodness-of-fit parameter for observed reflections | 1.006 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |