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CIF Information Card
Information card for 4114565
4114564 << 4114565 >> 4114566Preview
|
Coordinates |
4114565.cif |
Structure parameters
| Formula | - C36 H57.33 K2 O10 Si - |
| Calculated formula | - C32 H48 K2 O10 Si - |
| Title of publication | Structure and Chemistry of 1-Silafluorenyl Dianion, Its Derivatives, and an Organosilicon Diradical Dianion |
| Authors of publication | Yuxia Liu; Thomas C. Stringfellow; David Ballweg; Ilia A. Guzei; Robert West |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2002 |
| Journal volume | 124 |
| Pages of publication | 49 - 57 |
| a | 10.5459 ± 0.0009 Å |
| b | 15.9281 ± 0.0012 Å |
| c | 17.8197 ± 0.0015 Å |
| α | 95.02 ± 0.002° |
| β | 98.726 ± 0.002° |
| γ | 96.053 ± 0.002° |
| Cell volume | 2925.8 ± 0.4 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Hermann-Mauguin symmetry space group | P -1 |
| Hall symmetry space group | -P 1 |
| Residual factor for all reflections | 0.1203 |
| Residual factor for observed reflections | 0.063 |
| Weighted residual factors for the observed reflections | 0.169 |
| Weighted residual factors for all reflections included in the refinement | 0.1963 |
| Goodness-of-fit parameter for observed reflections | 1.026 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |