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CIF Information Card
Information card for 4114684
4114683 << 4114684 >> 4114685Preview
|
Coordinates |
4114684.cif |
Structure parameters
| Chemical name | cesium tin bismuth telluride (0.84/0.84/3.16/6) |
| Formula | - Bi3.16 Cs0.84 Sn0.84 Te6 - |
| Calculated formula | - Bi1.58 Cs0.42 Sn0.42 Te3 - |
| Title of publication | CsMBi3Te6 and CsM2Bi3Te7 (M = Pb, Sn): New Thermoelectric Compounds with Low-Dimensional Structures |
| Authors of publication | Kuei-Fang Hsu; Duck-Young Chung; Sangeeta Lal; Antje Mrotzek; Theodora Kyratsi; Tim Hogan; Mercouri G. Kanatzidis |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2002 |
| Journal volume | 124 |
| Pages of publication | 2410 - 2411 |
| a | 6.2613 ± 0.0007 Å |
| b | 28.479 ± 0.003 Å |
| c | 4.3207 ± 0.0005 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 770.45 ± 0.15 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 4 |
| Hermann-Mauguin symmetry space group | C m c m |
| Hall symmetry space group | -C 2c 2 |
| Residual factor for all reflections | 0.0557 |
| Residual factor for observed reflections | 0.0467 |
| Weighted residual factors for the observed reflections | 0.1358 |
| Weighted residual factors for all reflections included in the refinement | 0.1412 |
| Goodness-of-fit parameter for observed reflections | 1.213 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |