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CIF Information Card
Information card for 4114685
4114684 << 4114685 >> 4114686Preview
|
Coordinates |
4114685.cif |
Structure parameters
| Chemical name | cesium tin bismuth telluride (0.88/1.88/3.12/7) |
| Formula | - Bi3.12 Cs0.88 Sn1.88 Te7 - |
| Calculated formula | - Bi1.558 Cs0.44 Sn0.942 Te3.5 - |
| Title of publication | CsMBi3Te6 and CsM2Bi3Te7 (M = Pb, Sn): New Thermoelectric Compounds with Low-Dimensional Structures |
| Authors of publication | Kuei-Fang Hsu; Duck-Young Chung; Sangeeta Lal; Antje Mrotzek; Theodora Kyratsi; Tim Hogan; Mercouri G. Kanatzidis |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2002 |
| Journal volume | 124 |
| Pages of publication | 2410 - 2411 |
| a | 4.3881 ± 0.0006 Å |
| b | 33.139 ± 0.004 Å |
| c | 12.6075 ± 0.0016 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1833.3 ± 0.4 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 4 |
| Hermann-Mauguin symmetry space group | C m c m |
| Hall symmetry space group | -C 2c 2 |
| Residual factor for all reflections | 0.0487 |
| Residual factor for observed reflections | 0.0353 |
| Weighted residual factors for the observed reflections | 0.0872 |
| Weighted residual factors for all reflections included in the refinement | 0.0922 |
| Goodness-of-fit parameter for observed reflections | 1.018 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |