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CIF Information Card
Information card for 7101636
7101635 << 7101636 >> 7101637Preview
|
Coordinates |
7101636.cif |
Structure parameters
| Formula | - C47.5 H43 Cl N2 O9.5 P2 Ru3 Si - |
| Calculated formula | - C47.5 H39 Cl N2 O9.5 P2 Ru3 Si - |
| Title of publication | Trapping a pseudo-Hofmann rearrangement on a ruthenium cluster. |
| Authors of publication | Belletti, Daniele; Braunstein, Pierre; Messaoudi, Abdelatif; Pattacini, Roberto; Predieri, Giovanni; Tiripicchio, Antonio |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2006 |
| Journal issue | 2 |
| Pages of publication | 141 - 143 |
| a | 11.608 ± 0.003 Å |
| b | 13.277 ± 0.003 Å |
| c | 17.196 ± 0.003 Å |
| α | 81.92 ± 0.003° |
| β | 89.945 ± 0.003° |
| γ | 76.225 ± 0.003° |
| Cell volume | 2547.1 ± 1 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 8 |
| Hermann-Mauguin symmetry space group | P -1 |
| Hall symmetry space group | -P 1 |
| Residual factor for all reflections | 0.0539 |
| Residual factor for observed reflections | 0.035 |
| Weighted residual factors for the observed reflections | 0.0843 |
| Weighted residual factors for all reflections included in the refinement | 0.0883 |
| Goodness-of-fit parameter for observed reflections | 1.053 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |