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CIF Information Card
Information card for 7101696
7101695 << 7101696 >> 7101697Preview
|
Coordinates |
7101696.cif |
Structure parameters
| Formula | - C36 H22 F7 N O3 - |
| Calculated formula | - C36 H22 F7 N O3 - |
| Title of publication | Segregated assemblies in bridged electron-rich and electron-poor pi-conjugated moieties. |
| Authors of publication | Benanti, Travis L; Saejueng, Pranorm; Venkataraman, D |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2007 |
| Journal issue | 7 |
| Pages of publication | 692 - 694 |
| a | 5.6784 ± 0.0008 Å |
| b | 8.4377 ± 0.0011 Å |
| c | 31.313 ± 0.005 Å |
| α | 87.186 ± 0.006° |
| β | 87.102 ± 0.005° |
| γ | 79.417 ± 0.008° |
| Cell volume | 1471.7 ± 0.4 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 5 |
| Hermann-Mauguin symmetry space group | P -1 |
| Hall symmetry space group | -P 1 |
| Residual factor for all reflections | 0.1842 |
| Residual factor for observed reflections | 0.0924 |
| Weighted residual factors for the observed reflections | 0.1918 |
| Weighted residual factors for all reflections included in the refinement | 0.2428 |
| Goodness-of-fit parameter for observed reflections | 1.151 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |