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CIF Information Card
Information card for 7101697
7101696 << 7101697 >> 7101698Preview
|
Coordinates |
7101697.cif |
Structure parameters
| Formula | - C42 H28 F13 N O3 - |
| Calculated formula | - C42 H28 F13 N O3 - |
| Title of publication | Segregated assemblies in bridged electron-rich and electron-poor pi-conjugated moieties. |
| Authors of publication | Benanti, Travis L; Saejueng, Pranorm; Venkataraman, D |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2007 |
| Journal issue | 7 |
| Pages of publication | 692 - 694 |
| a | 5.8313 ± 0.0003 Å |
| b | 8.9482 ± 0.0005 Å |
| c | 36.872 ± 0.0019 Å |
| α | 90.655 ± 0.002° |
| β | 91.406 ± 0.002° |
| γ | 104.355 ± 0.002° |
| Cell volume | 1863.03 ± 0.17 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 5 |
| Hermann-Mauguin symmetry space group | P -1 |
| Hall symmetry space group | -P 1 |
| Residual factor for all reflections | 0.1775 |
| Residual factor for observed reflections | 0.1008 |
| Weighted residual factors for the observed reflections | 0.2332 |
| Weighted residual factors for all reflections included in the refinement | 0.2773 |
| Goodness-of-fit parameter for observed reflections | 1.047 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |