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CIF Information Card
Information card for 7101699
7101698 << 7101699 >> 7101700Preview
|
Coordinates |
7101699.cif |
Structure parameters
| Common name | ps04.178 |
| Formula | - C30 H17 N O2 - |
| Calculated formula | - C30 H17 N O2 - |
| Title of publication | Segregated assemblies in bridged electron-rich and electron-poor pi-conjugated moieties. |
| Authors of publication | Benanti, Travis L; Saejueng, Pranorm; Venkataraman, D |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2007 |
| Journal issue | 7 |
| Pages of publication | 692 - 694 |
| a | 9.329 ± 0.005 Å |
| b | 17.981 ± 0.005 Å |
| c | 25.306 ± 0.005 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 4245 ± 3 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 4 |
| Hermann-Mauguin symmetry space group | P c a b |
| Hall symmetry space group | -P 2bc 2ac |
| Residual factor for all reflections | 0.131 |
| Residual factor for observed reflections | 0.0554 |
| Weighted residual factors for the observed reflections | 0.1236 |
| Weighted residual factors for all reflections included in the refinement | 0.1538 |
| Goodness-of-fit parameter for observed reflections | 0.989 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |