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CIF Information Card
Information card for 7101844
7101843 << 7101844 >> 7101845Preview
|
Coordinates |
7101844.cif |
Structure parameters
| Formula | - C20 H36 Sn2 - |
| Calculated formula | - C20 H36 Sn2 - |
| Title of publication | The hexamethylpentalene dianion and other reagents for organometallic pentalene chemistry. |
| Authors of publication | Ashley, Andrew E; Cowley, Andrew R; O'Hare, Dermot |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2007 |
| Journal issue | 15 |
| Pages of publication | 1512 - 1514 |
| a | 7.8927 ± 0.0002 Å |
| b | 10.0097 ± 0.0002 Å |
| c | 14.9792 ± 0.0003 Å |
| α | 99.4761 ± 0.0007° |
| β | 101.899 ± 0.0007° |
| γ | 102.847 ± 0.0007° |
| Cell volume | 1101.18 ± 0.04 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 K |
| Sample thermal history | The material was crystallised at ambient temperature. A suitable crystal was cooled rapidly to 150K for single-crystal X-ray diffraction analysis. |
| Number of distinct elements | 3 |
| Hermann-Mauguin symmetry space group | P -1 |
| Hall symmetry space group | -P 1 |
| Residual factor for all reflections | 0.0315 |
| Residual factor for observed reflections | 0.0246 |
| Weighted residual factors for all reflections | 0.0349 |
| Weighted residual factors for the observed reflections | 0.029 |
| Weighted residual factors for all reflections included in the refinement | 0.029 |
| Goodness-of-fit parameter for observed reflections | 1.0405 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |