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CIF Information Card
Information card for 7101892
7101891 << 7101892 >> 7101893Preview
|
Coordinates |
7101892.cif |
Structure parameters
| Formula | - C70 H52 F6 N13 O4 P Ru2 - |
| Calculated formula | - C70 H52 F6 N13 O4 P Ru2 - |
| Title of publication | Cyclometalated ruthenium complexes for sensitizing nanocrystalline TiO2 solar cells. |
| Authors of publication | Wadman, Sipke H; Kroon, Jan M; Bakker, Klaas; Lutz, Martin; Spek, Anthony L; van Klink, Gerard P M; van Koten, Gerard |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2007 |
| Journal issue | 19 |
| Pages of publication | 1907 - 1909 |
| a | 9.535 ± 0.0001 Å |
| b | 15.4639 ± 0.0002 Å |
| c | 21.5139 ± 0.0003 Å |
| α | 97.2304 ± 0.0004° |
| β | 96.0597 ± 0.0005° |
| γ | 92.7702 ± 0.0006° |
| Cell volume | 3123.27 ± 0.07 Å3 |
| Cell temperature | 110 ± 2 K |
| Ambient diffraction temperature | 110 ± 2 K |
| Number of distinct elements | 7 |
| Hermann-Mauguin symmetry space group | P -1 |
| Hall symmetry space group | -P 1 |
| Residual factor for all reflections | 0.05 |
| Residual factor for observed reflections | 0.0362 |
| Weighted residual factors for the observed reflections | 0.0878 |
| Weighted residual factors for all reflections included in the refinement | 0.0955 |
| Goodness-of-fit parameter for observed reflections | 1.035 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |