#------------------------------------------------------------------------------ #$Date: 2015-10-07 20:48:34 +0300 (Wed, 07 Oct 2015) $ #$Revision: 340 $ #$URL: svn://localhost/tcod/cif/20/00/01/20000173.cif $ #------------------------------------------------------------------------------ # # This file is available in the Crystallography Open Database (COD), # http://www.crystallography.net/ # # All data on this site have been placed in the public domain by the # contributors. # data_20000173 loop_ _publ_author_name 'T. Bjorkman' 'S. Kurasch' 'O. Lehtinen' 'J. Kotakoski' 'O. V. Yazyev' 'A. Srivastava' 'V. Skakalova' 'J. H. Smet' 'U. Kaiser' 'A. V. Krasheninnikov' _publ_section_title ; Defects in bilayer silica and graphene: common trends in diverse hexagonal two-dimensional systems ; _chemical_formula_structural 'Si O2' _chemical_formula_sum 'O2 Si' _space_group_IT_number 191 _symmetry_cell_setting hexagonal _symmetry_Int_Tables_number 191 _symmetry_space_group_name_Hall '-P 6 2' _symmetry_space_group_name_H-M 'P 6/m m m' _cell_angle_alpha 90.00000 _cell_angle_beta 90.00000 _cell_angle_gamma 120.00000 _cell_formula_units_Z 4 _cell_length_a 5.31100 _cell_length_b 5.31100 _cell_length_c 24.00000 _cell_volume 586.266 _[local]_cod_data_source_file 2D-SiO2.cif _[local]_cod_data_source_block 2d-sio2 _[local]_cod_cif_authors_sg_H-M 'P 6/mmm' _[local]_cod_chemical_formula_sum_orig 'O2 Si1' _tcod_database_code 20000173 _tcod_software_package VASP _dft_XC_functional PBE _dft_basisset_type PAW _dft_basisset 600. _dft_cell_energy_conv 0.001 _dft_cell_relax_force_conv 0.01 _dft_BZ_integration_grid_X 6 _dft_BZ_integration_grid_Y 6 _dft_BZ_integration_grid_Z 1 _dft_BZ_integration_method 'Gaussian smearing' _dft_BZ_integration_smearing_width 0.1 loop_ _journal_name_full _journal_volume _journal_page_first _journal_year 'Scientific Reports' 3 3482 2013 loop_ _space_group_symop_operation_xyz x,y,z x-y,x,z -y,x-y,z -x,-y,z -x+y,-x,z y,-x+y,z x-y,-y,-z x,x-y,-z y,x,-z -x+y,y,-z -x,-x+y,-z -y,-x,-z -x,-y,-z -x+y,-x,-z y,-x+y,-z x,y,-z x-y,x,-z -y,x-y,-z -x+y,y,z -x,-x+y,z -y,-x,z x-y,-y,z x,x-y,z y,x,z loop_ _atom_site_label _atom_site_type_symbol _atom_site_fract_x _atom_site_fract_y _atom_site_fract_z _atom_site_occupancy Si1 Si 0.33333 0.66667 0.06771 1.00000 O1 O 0.33333 0.66667 0.00000 1.00000 O2 O 0.50000 0.00000 -0.09583 1.00000