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Information card for entry 1546293
Preview
| Coordinates | 1546293.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H34 Cl2 N2 Ni O P2 |
|---|---|
| Calculated formula | C20 H34 Cl2 N2 Ni O P2 |
| SMILES | [Ni]1([P@](C(C)(C)C)(C)c2nc3c(nc2[P@@]1(C(C)(C)C)C)cccc3)(Cl)Cl.OCC |
| Title of publication | Enantioselective Nickel-Catalyzed Mizoroki‒Heck Cyclizations To Generate Quaternary Stereocenters |
| Authors of publication | Desrosiers, Jean-Nicolas; Wen, Jialin; Tcyrulnikov, Sergei; Biswas, Soumik; Qu, Bo; Hie, Liana; Kurouski, Dmitry; Wu, Ling; Grinberg, Nelu; Haddad, Nizar; Busacca, Carl A.; Yee, Nathan K.; Song, Jinhua J.; Garg, Neil K.; Zhang, Xumu; Kozlowski, Marisa C.; Senanayake, Chris H. |
| Journal of publication | Organic Letters |
| Year of publication | 2017 |
| a | 8.1504 ± 0.0004 Å |
| b | 14.5588 ± 0.0006 Å |
| c | 10.2533 ± 0.0005 Å |
| α | 90° |
| β | 101.286 ± 0.003° |
| γ | 90° |
| Cell volume | 1193.13 ± 0.1 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 7 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.0207 |
| Residual factor for significantly intense reflections | 0.0202 |
| Weighted residual factors for significantly intense reflections | 0.0484 |
| Weighted residual factors for all reflections included in the refinement | 0.0486 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.023 |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 197744 (current) | 2017-06-13 | cif/ Adding structures of 1546293 via cif-deposit CGI script. |
1546293.cif |
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Users of the data should acknowledge the original authors of the
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