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Information card for entry 1571169
Preview
| Coordinates | 1571169.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | Bis[<i>S</i>-octyl 3-(2-methylpropylidene)dithiocarbazato-κ^2^<i>N</i>^3^,<i>S</i>]nickel(II) |
|---|---|
| Formula | C26 H50 N4 Ni S4 |
| Calculated formula | C26 H50 N4 Ni S4 |
| Title of publication | Bis[S-octyl 3-(2-methylpropylidene)dithiocarbazato-κ2 N 3,S]nickel(II) |
| Authors of publication | Khan, Sultana Shakila; Howlader, Md. Belayet Hossain; Sheikh, Md. Chanmiya; Miyatake, Ryuta; Zangrando, Ennio |
| Journal of publication | IUCrData |
| Year of publication | 2024 |
| Journal volume | 9 |
| Journal issue | 3 |
| a | 11.5962 ± 0.0004 Å |
| b | 18.4606 ± 0.0005 Å |
| c | 7.8973 ± 0.0002 Å |
| α | 90° |
| β | 106.532 ± 0.007° |
| γ | 90° |
| Cell volume | 1620.71 ± 0.1 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0549 |
| Residual factor for significantly intense reflections | 0.0359 |
| Weighted residual factors for significantly intense reflections | 0.0672 |
| Weighted residual factors for all reflections included in the refinement | 0.0723 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.041 |
| Diffraction radiation wavelength | 0.71075 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 290379 (current) | 2024-03-07 | cif/ Adding structures of 1571169 via cif-deposit CGI script. |
1571169.cif |
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Users of the data should acknowledge the original authors of the
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