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Information card for entry 1576214
Preview
| Coordinates | 1576214.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C92 H76 B Cl2 Cu4 N4 P4 |
|---|---|
| Calculated formula | C92 H76 B Cl2 Cu4 N4 P4 |
| Title of publication | Reductant-selected formation of copper nanoclusters with crystallization-induced emission enhancement performance. |
| Authors of publication | Tian, Ye; Xu, Wenlong; Zhu, Jian; Lu, Jiayu; Chen, Zhaohang; Alam, Fakhari; Shen, Honglei; Kang, Xi; Zhu, Manzhou |
| Journal of publication | Nanoscale |
| Year of publication | 2025 |
| Journal volume | 17 |
| Journal issue | 45 |
| Pages of publication | 26123 - 26128 |
| a | 16.0579 ± 0.0012 Å |
| b | 30.629 ± 0.002 Å |
| c | 18.1661 ± 0.0016 Å |
| α | 90° |
| β | 97.854 ± 0.007° |
| γ | 90° |
| Cell volume | 8851 ± 1.2 Å3 |
| Cell temperature | 120 K |
| Ambient diffraction temperature | 120 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0418 |
| Residual factor for significantly intense reflections | 0.0374 |
| Weighted residual factors for significantly intense reflections | 0.0992 |
| Weighted residual factors for all reflections included in the refinement | 0.1031 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.041 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54186 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 303850 (current) | 2025-11-29 | cif/ Updating files of 1576214 Original log message: Adding full bibliography for 1576214.cif. |
1576214.cif |
| 303184 | 2025-11-05 | cif/ Adding structures of 1576214 via cif-deposit CGI script. |
1576214.cif |
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