Crystallography Open Database

Information card for entry 2311703

Preview

Coordinates	2311703.cif
Original paper (by DOI)	HTML

Structure parameters

Common name	Compound_4
Formula	C20 H12 Br2 Se2
Calculated formula	C20 H12 Br2 Se2
SMILES	[Se](c1cccc2cccc(c12)Br)[Se]c1cccc2cccc(c12)Br
Title of publication	Nature of E<sub>2</sub>X<sub>2</sub> σ(4c-6e) of the X—E-E—X type at naphthalene 1,8-positions and model, elucidated by X-ray crystallographic analysis and QC calculations with the QTAIM approach.
Authors of publication	Tsubomoto, Yutaka; Hayashi, Satoko; Nakanishi, Waro; Sasamori, Takahiro; Tokitoh, Norihiro
Journal of publication	Acta crystallographica Section B, Structural science, crystal engineering and materials
Year of publication	2017
Journal volume	73
Journal issue	Pt 2
Pages of publication	265 - 275
a	7.8394 ± 0.0001 Å
b	8.0986 ± 0.0002 Å
c	15.065 ± 0.0004 Å
α	90.941 ± 0.001°
β	101.888 ± 0.001°
γ	111.093 ± 0.001°
Cell volume	868.92 ± 0.03 Å³
Cell temperature	103 ± 2 K
Ambient diffraction temperature	103 ± 2 K
Number of distinct elements	4
Space group number	2
Hermann-Mauguin space group symbol	P -1
Hall space group symbol	-P 1
Residual factor for all reflections	0.0432
Residual factor for significantly intense reflections	0.0391
Weighted residual factors for significantly intense reflections	0.0788
Weighted residual factors for all reflections included in the refinement	0.0805
Goodness-of-fit parameter for all reflections included in the refinement	1.198
Diffraction radiation wavelength	0.71075 Å
Diffraction radiation type	MoKα
Has coordinates	Yes
Has disorder	No
Has F_obs	No

Version history

Revision	Date	Message	Files
246090 (current)	2019-12-26	cif/ Adding structures of 2311701, 2311702, 2311703 via cif-deposit CGI script.	2311703.cif