Crystallography Open Database

Information card for entry 4089695

Preview

Coordinates	4089695.cif
Original paper (by DOI)	HTML

Structure parameters

Formula	C49 H111 Cl2 Eu O16 Si4
Calculated formula	C49 H111 Cl2 Eu O16 Si4
SMILES	[Eu]1(O[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C)([OH][Si](OC(C)(C)C)(OC(C)(C)C)[O]1C(C)(C)C)(O[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C)O[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C.ClCCl
Title of publication	Synthesis and Characterization of Rare Earth Siloxide Complexes, M[OSi(OtBu)3]3(L)x where L is HOSi(OtBu)3 and x = 0 or 1
Authors of publication	Lapadula, Giuseppe; Conley, Matthew P.; Copéret, Christophe; Andersen, Richard A.
Journal of publication	Organometallics
Year of publication	2014
Journal volume	34
Journal issue	11
Pages of publication	2271
a	13.7651 ± 0.0015 Å
b	13.8406 ± 0.0015 Å
c	21.602 ± 0.002 Å
α	75.5109 ± 0.0017°
β	81.1199 ± 0.0017°
γ	60.5631 ± 0.0015°
Cell volume	3467.8 ± 0.6 Å³
Cell temperature	100 K
Ambient diffraction temperature	100 K
Number of distinct elements	6
Space group number	1
Hermann-Mauguin space group symbol	P 1
Hall space group symbol	P 1
Residual factor for all reflections	0.0498
Residual factor for significantly intense reflections	0.0413
Weighted residual factors for significantly intense reflections	0.0967
Weighted residual factors for all reflections included in the refinement	0.1012
Goodness-of-fit parameter for all reflections included in the refinement	1.041
Diffraction radiation probe	x-ray
Diffraction radiation wavelength	0.71073 Å
Diffraction radiation type	MoKα
Diffraction radiation X-ray symbol	K-L~3~
Has coordinates	Yes
Has disorder	Yes
Has F_obs	No

Version history

Revision	Date	Message	Files
254024 (current)	2020-07-06	cif/4 Fixing Z values and formulae	4089695.cif
243723	2019-11-26	cif/ Adding structures of 4089694, 4089695, 4089696, 4089697, 4089698, 4089699, 4089700, 4089701, 4089702, 4089703 via cif-deposit CGI script.	4089695.cif