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Information card for entry 4124896
Preview
| Coordinates | 4124896.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C16 H3 F20 O2 Se |
|---|---|
| Calculated formula | C16 H3 F20 O2 Se |
| SMILES | [Se]12c3c(cccc3C(O2)(C(C(F)(F)F)(F)F)C(C(F)(F)F)(F)F)C(O1)(C(C(F)(F)F)(F)F)C(C(F)(F)F)(F)F |
| Title of publication | Isolation of Hypervalent Group-16 Radicals and Their Application in Organic-Radical Batteries. |
| Authors of publication | Imada, Yasuyuki; Nakano, Hideyuki; Furukawa, Ko; Kishi, Ryohei; Nakano, Masayoshi; Maruyama, Hitoshi; Nakamoto, Masaaki; Sekiguchi, Akira; Ogawa, Masahiro; Ohta, Toshiaki; Yamamoto, Yohsuke |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2016 |
| Journal volume | 138 |
| Journal issue | 2 |
| Pages of publication | 479 - 482 |
| a | 11.7263 ± 0.001 Å |
| b | 11.8526 ± 0.001 Å |
| c | 15.8755 ± 0.0013 Å |
| α | 90° |
| β | 105.809 ± 0.001° |
| γ | 90° |
| Cell volume | 2123 ± 0.3 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.0667 |
| Residual factor for significantly intense reflections | 0.0617 |
| Weighted residual factors for significantly intense reflections | 0.1723 |
| Weighted residual factors for all reflections included in the refinement | 0.1776 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.066 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 175687 (current) | 2016-02-04 | cif/ Adding structures of 4124890, 4124891, 4124892, 4124893, 4124894, 4124895, 4124896 via cif-deposit CGI script. |
4124896.cif |
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Users of the data should acknowledge the original authors of the
structural data.