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Information card for entry 4128087
Preview
| Coordinates | 4128087.cif | 
|---|---|
| Original paper (by DOI) | HTML | 
| Formula | C31 H48 Br Ni O P2 | 
|---|---|
| Calculated formula | C31 H48 Br Ni O P2 | 
| SMILES | [Ni]1(Br)[P](c2c3Oc4c([P]1(C(C)(C)C)C(C)(C)C)cccc4C(c3ccc2)(C)C)(C(C)(C)C)C(C)(C)C | 
| Title of publication | Mechanistic Characterization of (Xantphos)Ni(I)-Mediated Alkyl Bromide Activation: Oxidative Addition, Electron Transfer, or Halogen-Atom Abstraction. | 
| Authors of publication | Diccianni, Justin B.; Katigbak, Joseph; Hu, Chunhua; Diao, Tianning | 
| Journal of publication | Journal of the American Chemical Society | 
| Year of publication | 2019 | 
| Journal volume | 141 | 
| Journal issue | 4 | 
| Pages of publication | 1788 - 1796 | 
| a | 11.1629 ± 0.0009 Å | 
| b | 16.8436 ± 0.0013 Å | 
| c | 17.3026 ± 0.0013 Å | 
| α | 90° | 
| β | 105.449 ± 0.0013° | 
| γ | 90° | 
| Cell volume | 3135.8 ± 0.4 Å3 | 
| Cell temperature | 100 ± 2 K | 
| Ambient diffraction temperature | 100 ± 2 K | 
| Number of distinct elements | 6 | 
| Space group number | 14 | 
| Hermann-Mauguin space group symbol | P 1 21/c 1 | 
| Hall space group symbol | -P 2ybc | 
| Residual factor for all reflections | 0.0546 | 
| Residual factor for significantly intense reflections | 0.0394 | 
| Weighted residual factors for significantly intense reflections | 0.0889 | 
| Weighted residual factors for all reflections included in the refinement | 0.0947 | 
| Goodness-of-fit parameter for all reflections included in the refinement | 1.046 | 
| Diffraction radiation wavelength | 0.71073 Å | 
| Diffraction radiation type | MoKα | 
| Has coordinates | Yes | 
| Has disorder | No | 
| Has Fobs | No | 
| Revision | Date | Message | Files | 
|---|---|---|---|
| 221218 (current) | 2019-11-03 | cif/ Adding structures of 4128087 via cif-deposit CGI script.  | 
	4128087.cif | 
          All data in the COD and the database itself are dedicated to the
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    License
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          Users of the data should acknowledge the original authors of the
          structural data.