Crystallography Open Database

Information card for entry 4306766

Preview

Coordinates	4306766.cif
Original paper (by DOI)	HTML

Structure parameters

Formula	C18 H40 Ag2 F6 O6 S10 Si2
Calculated formula	C18 H40 Ag2 F6 O6 S10 Si2
SMILES	[Ag]12([S](C)C([Si]([C@@H]([S]2C)SC)(C)C)[S](C)[Ag]2([S](C([Si]([C@@H]([S]2C)SC)(C)C)[S]1C)C)OS(=O)(=O)C(F)(F)F)OS(=O)(=O)C(F)(F)F.[Ag]12([S](C)C([Si]([C@H]([S]2C)SC)(C)C)[S](C)[Ag]2([S](C([Si]([C@H]([S]2C)SC)(C)C)[S]1C)C)OS(=O)(=O)C(F)(F)F)OS(=O)(=O)C(F)(F)F
Title of publication	Silyl-Substituted Thioether Ligands and Their Ag(I) Complexes
Authors of publication	Chinwon Rim; Hongming Zhang; David Y. Son
Journal of publication	Inorganic Chemistry
Year of publication	2008
Journal volume	47
Pages of publication	11993 - 12003
a	13.5726 ± 0.001 Å
b	16.4573 ± 0.0012 Å
c	17.8509 ± 0.0013 Å
α	90°
β	106.19 ± 0.001°
γ	90°
Cell volume	3829.2 ± 0.5 Å³
Cell temperature	100 ± 2 K
Ambient diffraction temperature	100 ± 2 K
Number of distinct elements	7
Space group number	14
Hermann-Mauguin space group symbol	P 1 21/c 1
Hall space group symbol	-P 2ybc
Residual factor for all reflections	0.056
Residual factor for significantly intense reflections	0.053
Weighted residual factors for significantly intense reflections	0.133
Weighted residual factors for all reflections included in the refinement	0.137
Goodness-of-fit parameter for all reflections included in the refinement	1.108
Diffraction radiation wavelength	0.71073 Å
Diffraction radiation type	MoKα
Has coordinates	Yes
Has disorder	No
Has F_obs	No

Version history

Revision	Date	Message	Files
179105 (current)	2016-03-23	cif/4/30/ (antanas@kurmis) Replacing _[local]_cod_* tags with their equivalents from the COD CIF dictionary in multiple entries in subrange 4/30/67.	4306766.cif
120081	2014-07-12	Adding DOIs to range 4/30 structures.	4306766.cif
34330	2012-02-24	cif/4/ Reorganising CIF range 4 into a prefix tree.	4306766.cif
1167	2010-05-13	cif/ Adding data from the rest of 2009 RSC journals, Inorg-Chem-2008 and Chem-Comm-2010_18-19.	4306766.cif