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Information card for entry 4514444
Preview
Coordinates | 4514444.cif |
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Original paper (by DOI) | HTML |
Formula | C56 H49 B Cl3 Ir N2 O6 S2 |
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Calculated formula | C56 H49 B Cl3 Ir N2 O6 S2 |
SMILES | [Ir]123(OC(=CC(=[O]1)C)C)([n]1ccc4ccccc4c1c1cc4S(=O)(=O)c5ccccc5S(=O)(=O)c4cc21)[n]1c(c2c3cccc2)ccc(c1)B(c1c(cc(cc1C)C)C)c1c(cc(cc1C)C)C.ClC(Cl)Cl |
Title of publication | Highly Efficient Deep-Red Organic Light-Emitting Devices Based on Asymmetric Iridium(III) Complexes with the Thianthrene 5,5,10,10-Tetraoxide Moiety. |
Authors of publication | Sun, Yuanhui; Yang, Xiaolong; Feng, Zhao; Liu, Boao; Zhong, Daokun; Zhang, Junjie; Zhou, Guijiang; Wu, Zhaoxin |
Journal of publication | ACS applied materials & interfaces |
Year of publication | 2019 |
Journal volume | 11 |
Journal issue | 29 |
Pages of publication | 26152 - 26164 |
a | 17.1954 ± 0.0005 Å |
b | 11.6728 ± 0.0003 Å |
c | 25.8504 ± 0.0009 Å |
α | 90° |
β | 96.112 ± 0.003° |
γ | 90° |
Cell volume | 5159.2 ± 0.3 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173.15 K |
Number of distinct elements | 8 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.1154 |
Residual factor for significantly intense reflections | 0.0677 |
Weighted residual factors for significantly intense reflections | 0.1242 |
Weighted residual factors for all reflections included in the refinement | 0.1431 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.027 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
Revision | Date | Message | Files |
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219633 (current) | 2019-10-28 | cif/ Adding structures of 4514444 via cif-deposit CGI script. |
4514444.cif |
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Users of the data should acknowledge the original authors of the
structural data.