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Information card for entry 7234272
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Coordinates | 7234272.cif |
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Original paper (by DOI) | HTML |
Chemical name | hexyl-substituted anthra[1,2-b:4,3-b?:5,6-b??:8,7-b???]tetrathiophene |
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Formula | C46 H58 S4 |
Calculated formula | C46 H58 S4 |
Title of publication | Evaluation of semiconducting molecular thin films solution-processed via the photoprecursor approach: the case of hexyl-substituted thienoanthracenes |
Authors of publication | Cassandre Quinton; Mitsuharu Suzuki; Yoshitaka Kaneshige; Yuki Tatenaka; Chiho Katagiri; Yuji Yamaguchi; Daiki Kuzuhara; Naoki Aratani; Ken-ichi Nakayama; Hiroko Yamada |
Journal of publication | Journal of Materials Chemistry C |
Year of publication | 2015 |
Journal volume | 3 |
Pages of publication | 5995 - 6005 |
a | 12.604 ± 0.002 Å |
b | 4.8761 ± 0.0009 Å |
c | 32.657 ± 0.006 Å |
α | 90° |
β | 100.676 ± 0.004° |
γ | 90° |
Cell volume | 1972.3 ± 0.6 Å3 |
Cell temperature | 90 K |
Ambient diffraction temperature | 90 K |
Number of distinct elements | 3 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.1216 |
Residual factor for significantly intense reflections | 0.0574 |
Weighted residual factors for significantly intense reflections | 0.0906 |
Weighted residual factors for all reflections included in the refinement | 0.1098 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.013 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
Revision | Date | Message | Files |
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218962 (current) | 2019-10-01 | cif/ Adding structures of 7234272, 7234273, 7234274 via cif-deposit CGI script. |
7234272.cif |
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Users of the data should acknowledge the original authors of the
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