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Information card for entry 7237780
Preview
| Coordinates | 7237780.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C64 H56 N2 O12 |
|---|---|
| Calculated formula | C64 H56 N2 O12 |
| Title of publication | A partially-planarised hole-transporting quart-p-phenylene for perovskite solar cells |
| Authors of publication | Mora-Fuentes, Juan P.; Cortizo-Lacalle, Diego; Collavini, Silvia; Strutyński, Karol; Tress, Wolfgang R.; Saliba, Michael; Zakeeruddin, Shaik M.; Kosta, Ivet; Melle-Franco, Manuel; Grätzel, Michael; Delgado, Juan Luis; Mateo-Alonso, Aurelio |
| Journal of publication | Journal of Materials Chemistry C |
| Year of publication | 2019 |
| Journal volume | 7 |
| Journal issue | 15 |
| Pages of publication | 4332 |
| a | 26.1955 ± 0.0007 Å |
| b | 11.4152 ± 0.0002 Å |
| c | 19.6629 ± 0.0004 Å |
| α | 90° |
| β | 110.559 ± 0.003° |
| γ | 90° |
| Cell volume | 5505.3 ± 0.2 Å3 |
| Cell temperature | 150.01 ± 0.1 K |
| Ambient diffraction temperature | 150.01 ± 0.1 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0675 |
| Residual factor for significantly intense reflections | 0.0498 |
| Weighted residual factors for significantly intense reflections | 0.1285 |
| Weighted residual factors for all reflections included in the refinement | 0.1406 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.035 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 238602 (current) | 2019-11-24 | cif/ Adding structures of 7237780 via cif-deposit CGI script. |
7237780.cif |
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Users of the data should acknowledge the original authors of the
structural data.