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Information card for entry 7709462
Preview
| Coordinates | 7709462.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C30 H29 Cl Cu N7 O6 S2 |
|---|---|
| Calculated formula | C30 H29 Cl Cu N7 O6 S2 |
| SMILES | [Cu]12([n]3c(ccc(c3)C)NC(=[S]1)NC(=O)c1ccccc1)[n]1c(ccc(c1)C)NC(=[S]2)NC(=O)c1ccccc1.Cl(=O)(=O)(=O)[O-].C(#N)C |
| Title of publication | N,N′-Substituted thioureas and their metal complexes: syntheses, structures and electronic properties |
| Authors of publication | Al-Riyahee, Ali A. A.; Horton, Peter N.; Coles, Simon J.; Berry, Colin; Horrocks, Paul D.; Pope, Simon J. A.; Amoroso, Angelo J. |
| Journal of publication | Dalton Transactions |
| Year of publication | 2022 |
| a | 15.4602 ± 0.0011 Å |
| b | 9.7669 ± 0.0007 Å |
| c | 21.9107 ± 0.0015 Å |
| α | 90° |
| β | 109.196 ± 0.002° |
| γ | 90° |
| Cell volume | 3124.5 ± 0.4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0699 |
| Residual factor for significantly intense reflections | 0.0439 |
| Weighted residual factors for significantly intense reflections | 0.1027 |
| Weighted residual factors for all reflections included in the refinement | 0.1133 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.025 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71075 Å |
| Diffraction radiation type | MoKα |
| Diffraction radiation X-ray symbol | K-L~3~ |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 272906 (current) | 2022-02-11 | cif/ Adding structures of 7709462, 7709463, 7709464, 7709465, 7709466, 7709467, 7709468, 7709469 via cif-deposit CGI script. |
7709462.cif |
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Users of the data should acknowledge the original authors of the
structural data.