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Information card for entry 8106866
Preview
| Coordinates | 8106866.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | (1,10-Phenanthroline-κ^2^<i>N,N'</i>)bis(thiocyanato-κ<i>N</i>)platinum(II) |
|---|---|
| Formula | C14 H8 N4 Pt S2 |
| Calculated formula | C14 H8 N4 Pt S2 |
| SMILES | [Pt]1([n]2cccc3ccc4ccc[n]1c4c23)(N=C=S)N=C=S |
| Title of publication | Crystal structure of (1,10-phenanthroline-κ2 N,N′)bis(thiocyanato-κN)platinum(II), C14H8N4PtS2 |
| Authors of publication | Ha, Kwang |
| Journal of publication | Zeitschrift für Kristallographie - New Crystal Structures |
| Year of publication | 2016 |
| Journal volume | 231 |
| Journal issue | 1 |
| Pages of publication | 329 - 330 |
| a | 7.3318 ± 0.0007 Å |
| b | 15.13 ± 0.0015 Å |
| c | 12.5924 ± 0.0013 Å |
| α | 90° |
| β | 90.379 ± 0.002° |
| γ | 90° |
| Cell volume | 1396.8 ± 0.2 Å3 |
| Cell temperature | 183 ± 2 K |
| Ambient diffraction temperature | 183 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0445 |
| Residual factor for significantly intense reflections | 0.0349 |
| Weighted residual factors for significantly intense reflections | 0.0634 |
| Weighted residual factors for all reflections included in the refinement | 0.0668 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.169 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 281701 (current) | 2023-03-07 | cif/ Adding structures of 8106866 via cif-deposit CGI script. |
8106866.cif |
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Users of the data should acknowledge the original authors of the
structural data.