Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 1515302
Preview
Coordinates | 1515302.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C126.95 H54.95 Cl0.63 N4 Ni Sm |
---|---|
Calculated formula | C127.074 H55.164 Cl1.135 N4 Ni Sm0.9386 |
Title of publication | Sm@C2v(3)-C80: site-hopping motion of endohedral Sm atom and metal-induced effect on redox profile. |
Authors of publication | Xu, Wei; Niu, Ben; Shi, Zujin; Lian, Yongfu; Feng, Lai |
Journal of publication | Nanoscale |
Year of publication | 2012 |
Journal volume | 4 |
Journal issue | 21 |
Pages of publication | 6876 - 6879 |
a | 25.254 ± 0.003 Å |
b | 14.979 ± 0.0018 Å |
c | 19.724 ± 0.002 Å |
α | 90° |
β | 94.323 ± 0.001° |
γ | 90° |
Cell volume | 7440 ± 1.5 Å3 |
Cell temperature | 90 ± 2 K |
Ambient diffraction temperature | 93 ± 2 K |
Number of distinct elements | 6 |
Space group number | 12 |
Hermann-Mauguin space group symbol | C 1 2/m 1 |
Hall space group symbol | -C 2y |
Residual factor for all reflections | 0.0899 |
Residual factor for significantly intense reflections | 0.0706 |
Weighted residual factors for significantly intense reflections | 0.1773 |
Weighted residual factors for all reflections included in the refinement | 0.1933 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.022 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
Revision | Date | Message | Files |
---|---|---|---|
176729 (current) | 2016-02-18 | cif/ (antanas@echidna.ibt.lt) Replacing _[local]_cod_* tags with their equivalents from the COD CIF dictionary in multiple entries in range 1. |
1515302.cif |
111104 | 2014-04-20 | cif/ Adding structures of 1515302 via cif-deposit CGI script. |
1515302.cif |
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.