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Information card for entry 1517992
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| Coordinates | 1517992.cif |
|---|
| Formula | Ge4 Na8 Te10 |
|---|---|
| Calculated formula | Ge4 Na8 Te10 |
| SMILES | [Na+].[Na+].[Na+].[Te-][Ge]1([Te-])[Ge]([Te-])([Te-])[Te][Ge]([Ge]([Te-])([Te-])[Te-])([Te-])[Te]1.[Na+].[Na+].[Na+].[Na+].[Na+] |
| Title of publication | Neuartige Si4Te10(8-) und Ge4Te10(8-) anionen im Na8Si4Te10 bzw. Na8Ge4Te10 |
| Authors of publication | Eisenmann, Brigitte; Schwerer, Heike; Schafer, Herbert |
| Journal of publication | Revue de Chimie Minerale' |
| Year of publication | 1983 |
| Journal volume | 20 |
| Pages of publication | 78 - 87 |
| a | 14.128 ± 0.012 Å |
| b | 12.938 ± 0.012 Å |
| c | 15.028 ± 0.012 Å |
| α | 90° |
| β | 92.71 ± 0.1° |
| γ | 90° |
| Cell volume | 2744 ± 4 Å3 |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 3 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Weighted residual factors for significantly intense reflections | 0.099 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 176435 (current) | 2016-02-14 | cif/ (antanas@kurmis) Replacing _[local]_cod_* tags with their equivalents from the COD CIF dictionary in multiple entries from ranges 1, 2. |
1517992.cif |
| 125369 | 2014-10-15 | cif/ Adding structures of 1517992 via cif-deposit CGI script. |
1517992.cif |
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Users of the data should acknowledge the original authors of the
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