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Information card for entry 1520549
Preview
| Coordinates | 1520549.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C18 H28 Br10 N2 Te2 |
|---|---|
| Calculated formula | C18 Br10 N2 Te2 |
| SMILES | [Te]1(Br)(Br)(Br)(Br)[Br][Te](Br)(Br)(Br)(Br)[Br]1.[N+](C)(C)(c1ccccc1)C.[N+](C)(C)(C)c1ccccc1 |
| Title of publication | Reaction of TeBr4 with SbBr3 in the Presence of [C6H5(CH3)3N]Br: Crystal Structures of [C6H5(CH3)3N]2[Te2Br10] and [C6H5(CH3)3N][SbTeOBr6] |
| Authors of publication | Hauge, Sverre; Janickis, Vitalijus; Maroy, Kjartan |
| Journal of publication | Acta Chemica Scandinavica |
| Year of publication | 1999 |
| Journal volume | 53 |
| Pages of publication | 992 - 996 |
| a | 8.354 ± 0.002 Å |
| b | 11.683 ± 0.003 Å |
| c | 17.753 ± 0.004 Å |
| α | 90° |
| β | 99.52 ± 0.03° |
| γ | 90° |
| Cell volume | 1708.8 ± 0.7 Å3 |
| Ambient diffraction temperature | 263 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for significantly intense reflections | 0.074 |
| Weighted residual factors for significantly intense reflections | 0.1725 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.946 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 176428 (current) | 2016-02-13 | Replaced deprecated COD CIF data names with their more modern alternatives. The _cod_cif_authors_sg_Hall and _cod_cif_authors_sg_H-M data items were renamed to _cod_original_sg_symbol_Hall and _cod_cif_authors_sg_H-M respectively. |
1520549.cif |
| 139287 | 2015-06-17 | cif/ Adding structures of 1520549 via cif-deposit CGI script. |
1520549.cif |
All data in the COD and the database itself are dedicated to the
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Users of the data should acknowledge the original authors of the
structural data.