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Information card for entry 1540677
Preview
| Coordinates | 1540677.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | I2@SL-1 |
|---|---|
| Chemical name | Iodine silicalite-1 |
| Formula | I24 O192 Si96 |
| Calculated formula | I23.9872 O192 Si96 |
| Title of publication | Capture of iodine and organic iodides using silica zeolites and the semiconductor behaviour of iodine in a silica zeolite |
| Authors of publication | Pham, Tung Cao Thanh; Docao, Son; Hwang, In Chul; Song, Mee Kyung; Choi, Do Young; Moon, Dohyun; Oleynikov, Peter; Yoon, Kyung Byung |
| Journal of publication | Energy Environ. Sci. |
| Year of publication | 2016 |
| Journal volume | 9 |
| Journal issue | 3 |
| Pages of publication | 1050 |
| a | 20.1 ± 0.004 Å |
| b | 19.912 ± 0.004 Å |
| c | 13.386 ± 0.003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 5357.5 ± 1.9 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 62 |
| Hermann-Mauguin space group symbol | P n m a |
| Hall space group symbol | -P 2ac 2n |
| Residual factor for all reflections | 0.0926 |
| Residual factor for significantly intense reflections | 0.0616 |
| Weighted residual factors for significantly intense reflections | 0.1559 |
| Weighted residual factors for all reflections included in the refinement | 0.1716 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.027 |
| Diffraction radiation wavelength | 0.67 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 181746 (current) | 2016-04-05 | cif/ Updating files of 1540676, 1540677, 1540678, 1540679 Original log message: Adding full bibliography for 1540676--1540679.cif. |
1540677.cif |
| 171391 | 2015-12-10 | cif/ Adding structures of 1540676, 1540677, 1540678, 1540679 via cif-deposit CGI script. |
1540677.cif |
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Users of the data should acknowledge the original authors of the
structural data.