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Information card for entry 1543351
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| Coordinates | 1543351.cif |
|---|---|
| Structure factors | 1543351.hkl |
| Original IUCr paper | HTML |
| Chemical name | Bis(μ-diethyl sulfide-κ^2^<i>S</i>:<i>S</i>)bis[(biphenyl-2,2'-diyl)platinum(ll)] |
|---|---|
| Formula | C32 H36 Pt2 S2 |
| Calculated formula | C32 H36 Pt2 S2 |
| SMILES | [Pt]12(c3c(cccc3)c3c2cccc3)S([Pt]2(c3ccccc3c3c2cccc3)S1(CC)CC)(CC)CC |
| Title of publication | Bis(μ-diethyl sulfide-κ^2^<i>S</i>:<i>S</i>)bis[(biphenyl-2,2'-diyl)platinum(ll)] |
| Authors of publication | Rillema, D. Paul; Moore, Curtis; Jehan, Ali |
| Journal of publication | IUCrData |
| Year of publication | 2016 |
| Journal volume | 1 |
| Journal issue | 5 |
| Pages of publication | x160789 |
| a | 19.2938 ± 0.0015 Å |
| b | 7.8839 ± 0.0006 Å |
| c | 19.6969 ± 0.0017 Å |
| α | 90° |
| β | 109.639 ± 0.005° |
| γ | 90° |
| Cell volume | 2821.8 ± 0.4 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0456 |
| Residual factor for significantly intense reflections | 0.0333 |
| Weighted residual factors for significantly intense reflections | 0.0633 |
| Weighted residual factors for all reflections included in the refinement | 0.0664 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.097 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
| Revision | Date | Message | Files |
|---|---|---|---|
| 183067 (current) | 2016-05-21 | cif/ hkl/ Adding structures of 1543351 via cif-deposit CGI script. |
1543351.cif 1543351.hkl |
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Users of the data should acknowledge the original authors of the
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