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Information card for entry 1543351
Preview
Coordinates | 1543351.cif |
---|---|
Structure factors | 1543351.hkl |
Original IUCr paper | HTML |
Chemical name | Bis(μ-diethyl sulfide-κ^2^<i>S</i>:<i>S</i>)bis[(biphenyl-2,2'-diyl)platinum(ll)] |
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Formula | C32 H36 Pt2 S2 |
Calculated formula | C32 H36 Pt2 S2 |
SMILES | [Pt]12(c3c(cccc3)c3c2cccc3)S([Pt]2(c3ccccc3c3c2cccc3)S1(CC)CC)(CC)CC |
Title of publication | Bis(μ-diethyl sulfide-κ^2^<i>S</i>:<i>S</i>)bis[(biphenyl-2,2'-diyl)platinum(ll)] |
Authors of publication | Rillema, D. Paul; Moore, Curtis; Jehan, Ali |
Journal of publication | IUCrData |
Year of publication | 2016 |
Journal volume | 1 |
Journal issue | 5 |
Pages of publication | x160789 |
a | 19.2938 ± 0.0015 Å |
b | 7.8839 ± 0.0006 Å |
c | 19.6969 ± 0.0017 Å |
α | 90° |
β | 109.639 ± 0.005° |
γ | 90° |
Cell volume | 2821.8 ± 0.4 Å3 |
Cell temperature | 100 K |
Ambient diffraction temperature | 100 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0456 |
Residual factor for significantly intense reflections | 0.0333 |
Weighted residual factors for significantly intense reflections | 0.0633 |
Weighted residual factors for all reflections included in the refinement | 0.0664 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.097 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
Revision | Date | Message | Files |
---|---|---|---|
183067 (current) | 2016-05-21 | cif/ hkl/ Adding structures of 1543351 via cif-deposit CGI script. |
1543351.cif 1543351.hkl |
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Users of the data should acknowledge the original authors of the
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