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Information card for entry 1543510
Preview
| Coordinates | 1543510.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C18 H40 N6 Ni S2 |
|---|---|
| Calculated formula | C18 N6 Ni S2 |
| SMILES | [Ni]12(N=C=S)([NH](CC[NH]1CCC)CCC)([NH](CC[NH]2CCC)CCC)N=C=S |
| Title of publication | Syntheses and Characterization of N,N'-Dipropyl-1,2-ethanediamine and N,N'-diisopropyl-1,2-ethanediamine Complexes of Nickel(II): Thermal Studies and X-Ray Single Crystal Structure Analysis of [Ni(N,N'-Dipropyl-1,2-ethanediamine)2(NCS)2] |
| Authors of publication | Laskar, Inamur Rahaman; Das, Debasis; Mostafa, Golam; Welch, Alan J.; Chaudhuri, Nirmalendu Ray |
| Journal of publication | Acta Chemica Scandinavica |
| Year of publication | 1998 |
| Journal volume | 52 |
| Pages of publication | 702 - 708 |
| a | 9.246 ± 0.009 Å |
| b | 9.2633 ± 0.0005 Å |
| c | 14.465 ± 0.0008 Å |
| α | 90° |
| β | 92.082 ± 0.005° |
| γ | 90° |
| Cell volume | 1238.1 ± 1.2 Å3 |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0606 |
| Residual factor for significantly intense reflections | 0.0381 |
| Weighted residual factors for significantly intense reflections | 0.0835 |
| Weighted residual factors for all reflections included in the refinement | 0.0947 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.071 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 183885 (current) | 2016-06-23 | cif/ Adding structures of 1543510 via cif-deposit CGI script. |
1543510.cif |
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Users of the data should acknowledge the original authors of the
structural data.