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Information card for entry 1543682
Preview
| Coordinates | 1543682.cif |
|---|---|
| Structure factors | 1543682.hkl |
| Original paper (by DOI) | HTML |
| Chemical name | Bis[<i>S</i>-hexyl 3-(thiophen-2-ylmethylidene)dithiocarbazato-κ^2^<i>N</i>^3^,<i>S</i>]palladium(II) |
|---|---|
| Formula | C24 H34 N4 Pd S6 |
| Calculated formula | C24 H34 N4 Pd S6 |
| SMILES | [Pd]12([N](N=C(S1)SCCCCCC)=Cc1sccc1)SC(=N[N]2=Cc1sccc1)SCCCCCC |
| Title of publication | Bis[<i>S</i>-hexyl 3-(thiophen-2-ylmethylidene)dithiocarbazato-κ^2^<i>N</i>^3^,<i>S</i>]palladium(II) |
| Authors of publication | Begum, K.; Sheikh, M. C.; Miyatake, R.; Zangrando, E.; Begum, M. S. |
| Journal of publication | IUCrData |
| Year of publication | 2016 |
| Journal volume | 1 |
| Journal issue | 7 |
| Pages of publication | x161132 |
| a | 13.9118 ± 0.0003 Å |
| b | 10.37486 ± 0.00019 Å |
| c | 20.6696 ± 0.0004 Å |
| α | 90° |
| β | 103.929 ± 0.0007° |
| γ | 90° |
| Cell volume | 2895.58 ± 0.1 Å3 |
| Cell temperature | 173 K |
| Ambient diffraction temperature | 173 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for significantly intense reflections | 0.0206 |
| Weighted residual factors for all reflections included in the refinement | 0.0554 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.079 |
| Diffraction radiation wavelength | 0.71075 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
| Revision | Date | Message | Files |
|---|---|---|---|
| 184533 (current) | 2016-07-20 | cif/ hkl/ Adding structures of 1543682 via cif-deposit CGI script. |
1543682.cif 1543682.hkl |
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Users of the data should acknowledge the original authors of the
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