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Information card for entry 1544792
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| Coordinates | 1544792.cif |
|---|---|
| Structure factors | 1544792.hkl |
| Original IUCr paper | HTML |
| Chemical name | 1,4-Bis{5-[bis(propan-2-yloxy)phosphoryl]thiophen-2-yl}-2,5-dipropoxybenzene |
|---|---|
| Formula | C32 H48 O8 P2 S2 |
| Calculated formula | C32 H48 O8 P2 S2 |
| SMILES | s1c(c2cc(OCCC)c(cc2OCCC)c2sc(P(=O)(OC(C)C)OC(C)C)cc2)ccc1P(OC(C)C)(OC(C)C)=O |
| Title of publication | 1,4-Bis{5-[bis(propan-2-yloxy)phosphoryl]thiophen-2-yl}-2,5-dipropoxybenzene |
| Authors of publication | Detert, Heiner; Schollmeyer, Dieter |
| Journal of publication | IUCrData |
| Year of publication | 2016 |
| Journal volume | 1 |
| Journal issue | 12 |
| Pages of publication | x161963 |
| a | 13.6507 ± 0.0008 Å |
| b | 18.8828 ± 0.0011 Å |
| c | 14.5033 ± 0.0008 Å |
| α | 90° |
| β | 103.279 ± 0.005° |
| γ | 90° |
| Cell volume | 3638.5 ± 0.4 Å3 |
| Cell temperature | 248 ± 2 K |
| Ambient diffraction temperature | 248 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.2121 |
| Residual factor for significantly intense reflections | 0.0914 |
| Weighted residual factors for significantly intense reflections | 0.2383 |
| Weighted residual factors for all reflections included in the refinement | 0.3037 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.949 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | Yes |
| Revision | Date | Message | Files |
|---|---|---|---|
| 189170 (current) | 2016-12-17 | cif/ hkl/ Adding structures of 1544792 via cif-deposit CGI script. |
1544792.cif 1544792.hkl |
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Users of the data should acknowledge the original authors of the
structural data.