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Information card for entry 1546557
Preview
| Coordinates | 1546557.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C43 H64 Cl4 N4 O3 Si Zn2 |
|---|---|
| Calculated formula | C43 H64 Cl4 N4 O3 Si Zn2 |
| SMILES | [Zn](Cl)(Cl)([Si]1([Zn](Cl)Cl)=C2N(C=CN2CN2C=1N(C=C2)c1c(cccc1C(C)C)C(C)C)c1c(C(C)C)cccc1C(C)C)[O]1CCCC1.O1CCCC1.O1CCCC1 |
| Title of publication | A New Area in Main-Group Chemistry: Zerovalent Monoatomic Silicon Compounds and Their Analogues |
| Authors of publication | Yao, Shenglai; Xiong, Yun; Driess, Matthias |
| Journal of publication | Accounts of Chemical Research |
| Year of publication | 2017 |
| a | 12.7971 ± 0.0006 Å |
| b | 12.8687 ± 0.0004 Å |
| c | 15.4609 ± 0.0007 Å |
| α | 99.546 ± 0.003° |
| β | 92.234 ± 0.004° |
| γ | 106.915 ± 0.004° |
| Cell volume | 2391.96 ± 0.18 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0553 |
| Residual factor for significantly intense reflections | 0.0522 |
| Weighted residual factors for significantly intense reflections | 0.1501 |
| Weighted residual factors for all reflections included in the refinement | 0.1537 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.112 |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 198859 (current) | 2017-07-21 | cif/ Adding structures of 1546557 via cif-deposit CGI script. |
1546557.cif |
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