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Information card for entry 1548533
Preview
| Coordinates | 1548533.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C27 H41 O2 W0.5 |
|---|---|
| Calculated formula | C27 H41 O2 W0.5 |
| SMILES | [W](=C)(Oc1c(cccc1C(C)C)C(C)C)(Oc1c(cccc1C(C)C)C(C)C)(Oc1c(cccc1C(C)C)C(C)C)Oc1c(cccc1C(C)C)C(C)C.CCCC |
| Title of publication | Diazomethane umpolung atop anthracene: an electrophilic methylene transfer reagent. |
| Authors of publication | Joost, Maximilian; Transue, Wesley J.; Cummins, Christopher C. |
| Journal of publication | Chemical science |
| Year of publication | 2018 |
| Journal volume | 9 |
| Journal issue | 6 |
| Pages of publication | 1540 - 1543 |
| a | 15.0937 ± 0.0012 Å |
| b | 17.6924 ± 0.0014 Å |
| c | 9.6626 ± 0.0008 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2580.3 ± 0.4 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 18 |
| Hermann-Mauguin space group symbol | P 21 21 2 |
| Hall space group symbol | P 2 2ab |
| Residual factor for all reflections | 0.0311 |
| Residual factor for significantly intense reflections | 0.0234 |
| Weighted residual factors for significantly intense reflections | 0.0487 |
| Weighted residual factors for all reflections included in the refinement | 0.0511 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.06 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 228737 (current) | 2019-11-17 | cif/ Updating files of 1548532, 1548533, 1548534 Original log message: Adding full bibliography for 1548532--1548534.cif. |
1548533.cif |
| 204468 | 2017-12-22 | cif/ Adding structures of 1548532, 1548533, 1548534 via cif-deposit CGI script. |
1548533.cif |
All data in the COD and the database itself are dedicated to the
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Users of the data should acknowledge the original authors of the
structural data.