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Information card for entry 1548666
Preview
Coordinates | 1548666.cif |
---|---|
Structure factors | 1548666.hkl |
Original IUCr paper | HTML |
Chemical name | Tetraphenylphosphonium tetrakis(trimethylsilanolato)ferrate(III) |
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Formula | C36 H56 Fe O4 P Si4 |
Calculated formula | C36 H56 Fe O4 P Si4 |
SMILES | [Fe](O[Si](C)(C)C)(O[Si](C)(C)C)(O[Si](C)(C)C)O[Si](C)(C)C.[P+](c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Tetraphenylphosphonium tetrakis(trimethylsilanolato)ferrate(III) |
Authors of publication | Hay, Michael T.; Yennawar, Hemant P. |
Journal of publication | IUCrData |
Year of publication | 2018 |
Journal volume | 3 |
Journal issue | 1 |
Pages of publication | x171823 |
a | 12.589 ± 0.007 Å |
b | 12.589 ± 0.007 Å |
c | 13.689 ± 0.007 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 2169 ± 2 Å3 |
Cell temperature | 223 ± 2 K |
Ambient diffraction temperature | 223 ± 2 K |
Number of distinct elements | 6 |
Space group number | 82 |
Hermann-Mauguin space group symbol | I -4 |
Hall space group symbol | I -4 |
Residual factor for all reflections | 0.044 |
Residual factor for significantly intense reflections | 0.0361 |
Weighted residual factors for significantly intense reflections | 0.075 |
Weighted residual factors for all reflections included in the refinement | 0.078 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.916 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
Revision | Date | Message | Files |
---|---|---|---|
206147 (current) | 2018-02-04 | cif/ Updating files of 1548666 Original log message: Adding full bibliography for 1548666.cif. |
1548666.cif 1548666.hkl |
205174 | 2018-01-13 | cif/ hkl/ Adding structures of 1548666 via cif-deposit CGI script. |
1548666.cif 1548666.hkl |
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Users of the data should acknowledge the original authors of the
structural data.