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Information card for entry 1549600
Preview
| Coordinates | 1549600.cif |
|---|---|
| Original IUCr paper | HTML |
| Formula | Al4.868 O9.566 Si1.132 |
|---|---|
| Calculated formula | Al4.868 O9.566 Si1.132 |
| Title of publication | Exploiting superspace to clarify vacancy and Al/Si ordering in mullite |
| Authors of publication | Klar, Paul Benjamin; Etxebarria, Iñigo; Madariaga, Gotzon |
| Journal of publication | IUCrJ |
| Year of publication | 2018 |
| Journal volume | 5 |
| Journal issue | 4 |
| a | 7.5768 ± 0.0013 Å |
| b | 7.676 ± 0.0016 Å |
| c | 2.8833 ± 0.0012 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 167.69 ± 0.08 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 3 |
| Space group number | 55 |
| Hermann-Mauguin space group symbol | P b a m |
| Hall space group symbol | -P 2 2ab |
| Residual factor for all reflections | 0.0423 |
| Residual factor for significantly intense reflections | 0.0374 |
| Weighted residual factors for significantly intense reflections | 0.1056 |
| Weighted residual factors for all reflections included in the refinement | 0.1105 |
| Goodness-of-fit parameter for significantly intense reflections | 1.95 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.44 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.7231 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 208623 (current) | 2018-06-25 | cif/ Adding structures of 1549598, 1549599, 1549600, 1549601 via cif-deposit CGI script. |
1549600.cif |
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Users of the data should acknowledge the original authors of the
structural data.