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Information card for entry 1550098
Preview
| Coordinates | 1550098.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C52 H58 Cl2 N10 O8 Pd |
|---|---|
| Calculated formula | C52 H58 Cl2 N10 O8 Pd |
| SMILES | [Pd](Cl)(Cl)([n]1ccc(/N=N/c2ccc(NC(=O)c3cc(OCC)c(OCC)c(OCC)c3)cc2)cc1)[n]1ccc(/N=N/c2ccc(NC(=O)c3cc(OCC)c(OCC)c(OCC)c3)cc2)cc1.N#CC.N#CC |
| Title of publication | Influence of Metal Coordination and Light Irradiation on Hierarchical Self-Assembly Processes |
| Authors of publication | Kartha, Kalathil K.; Allampally, Naveen Kumar; Politi, Antiope T.; Prabhu, Deepak Dayanandan; Ouchi, Hayato; Albuquerque, Rodrigo Q.; Yagai, Shiki; Fernandez, Gustavo |
| Journal of publication | Chemical Science |
| Year of publication | 2019 |
| a | 10.6996 ± 0.0003 Å |
| b | 11.6143 ± 0.0004 Å |
| c | 11.6936 ± 0.0004 Å |
| α | 73.834 ± 0.0008° |
| β | 68.49 ± 0.0008° |
| γ | 74.621 ± 0.0009° |
| Cell volume | 1276.66 ± 0.07 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.03 |
| Residual factor for significantly intense reflections | 0.0299 |
| Weighted residual factors for significantly intense reflections | 0.079 |
| Weighted residual factors for all reflections included in the refinement | 0.0791 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.051 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 211643 (current) | 2018-10-26 | cif/ Adding structures of 1550098 via cif-deposit CGI script. |
1550098.cif |
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Users of the data should acknowledge the original authors of the
structural data.