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Information card for entry 1550254
Preview
| Coordinates | 1550254.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C74 H111 N5 O6 Se |
|---|---|
| Calculated formula | C70 H100 N5 O5 Se |
| SMILES | [SeH-].O=C(Nc1c(C#Cc2cc(cc(c2)C(C)(C)C)C#Cc2c(NC(=O)Nc3ccc(OC)cc3)ccc(c2)C(C)(C)C)cc(cc1)C(C)(C)C)Nc1ccc(OC)cc1.O(CC)CC.[N+](CCCC)(CCCC)(CCCC)CCCC |
| Title of publication | Expanding Reversible Chalcogenide Binding: Supramolecular Receptors for the Hydroselenide (HSe‒) Anion |
| Authors of publication | Fargher, Hazel; Lau, Nathanael; Zakharov, Lev; Haley, Michael M.; Johnson, Darren; Pluth, Michael D. |
| Journal of publication | Chemical Science |
| Year of publication | 2019 |
| a | 9.5547 ± 0.0004 Å |
| b | 30.3155 ± 0.0013 Å |
| c | 26.1228 ± 0.001 Å |
| α | 90° |
| β | 90.476 ± 0.002° |
| γ | 90° |
| Cell volume | 7566.4 ± 0.5 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.1124 |
| Residual factor for significantly intense reflections | 0.0921 |
| Weighted residual factors for significantly intense reflections | 0.2381 |
| Weighted residual factors for all reflections included in the refinement | 0.2492 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.05 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 212048 (current) | 2018-11-20 | cif/ Adding structures of 1550252, 1550253, 1550254 via cif-deposit CGI script. |
1550254.cif |
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Users of the data should acknowledge the original authors of the
structural data.