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Information card for entry 1551600
Preview
Coordinates | 1551600.cif |
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Original paper (by DOI) | HTML |
Formula | C10 H28 Cl2 N2 O2 Ru S2 |
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Calculated formula | C10 H28 Cl2 N2 O2 Ru S2 |
SMILES | [Ru]1(Cl)(Cl)([S](=O)(C)C)([S](=O)(C)C)[N](CC[N]1(C)C)(C)C |
Title of publication | Crystal Structure of <i>Trans</i>(Cl),<i>cis</i>(S)-dichlorobis(dimethyl sulfoxide-<i>S</i>)(<i>N,N,N</i>′,<i>N</i>′-tetramethylethylenediamine)ruthenium(II) |
Authors of publication | TOYAMA, Mari; IWATSUKI, Satoshi; NAGAO, Noriharu |
Journal of publication | X-ray Structure Analysis Online |
Year of publication | 2016 |
Journal volume | 32 |
Journal issue | 0 |
Pages of publication | 25 |
a | 8.616 ± 0.005 Å |
b | 22.925 ± 0.012 Å |
c | 8.991 ± 0.005 Å |
α | 90° |
β | 94.415 ± 0.006° |
γ | 90° |
Cell volume | 1770.6 ± 1.7 Å3 |
Cell temperature | 173 K |
Ambient diffraction temperature | 173 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0668 |
Residual factor for significantly intense reflections | 0.054 |
Weighted residual factors for significantly intense reflections | 0.1305 |
Weighted residual factors for all reflections included in the refinement | 0.1359 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.015 |
Diffraction radiation wavelength | 0.71075 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
Revision | Date | Message | Files |
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216211 (current) | 2019-06-20 | cif/ Adding structures of 1551600 via cif-deposit CGI script. |
1551600.cif |
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