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Information card for entry 1551691
Preview
Coordinates | 1551691.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | bis(O-propyldithiocarbonato-k2S,S?)(3,5-lutidine-kN)nickel(II) |
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Formula | C22 H32 N2 Ni O2 S4 |
Calculated formula | C22 H32 N2 Ni O2 S4 |
SMILES | c1c(cc(c[n]1[Ni]12([S]=C(OCCC)S1)([n]1cc(cc(c1)C)C)[S]=C(OCCC)S2)C)C |
Title of publication | Crystal Structure of Bis(O-propyldithiocarbonato-^|^kappa;2S,S^|^prime;)(3,5-lutidine-^|^kappa;N)nickel(II) |
Authors of publication | SHARMA, Neerupama; SINGH, Kuldeep; SACHAR, Renu; GUPTA, Vivek K.; Rajnikant, |
Journal of publication | X-ray Structure Analysis Online |
Year of publication | 2013 |
Journal volume | 29 |
Journal issue | 0 |
Pages of publication | 19 |
a | 7.008 ± 0.005 Å |
b | 9.546 ± 0.005 Å |
c | 10.621 ± 0.005 Å |
α | 87.484 ± 0.005° |
β | 72.927 ± 0.005° |
γ | 75.686 ± 0.005° |
Cell volume | 657.8 ± 0.7 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0501 |
Residual factor for significantly intense reflections | 0.0371 |
Weighted residual factors for significantly intense reflections | 0.0872 |
Weighted residual factors for all reflections included in the refinement | 0.0961 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.029 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
Revision | Date | Message | Files |
---|---|---|---|
216302 (current) | 2019-06-20 | cif/ Adding structures of 1551691 via cif-deposit CGI script. |
1551691.cif |
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Users of the data should acknowledge the original authors of the
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